Diagnostics and Prognostics of Wire-Bonded Power Semi-Conductor Modules subject to DC Power Cycling with Physically-Inspired Models and Particle Filter

##plugins.themes.bootstrap3.article.main##

##plugins.themes.bootstrap3.article.sidebar##

Published Jul 2, 2018
Nicolas Degrenne Stefan Mollov

Abstract

This paper presents an algorithm for determining the State of Health (SoH) and the Remaining Useful Life (RUL) of wire-bonded power semi-conductor modules. It is hybrid in the sense that it combines the estimations of physically-inspired models and the on-line data acquisition. A key aspect is the analysis, modeling, estimation, correction and exploitation of the on-state voltage Von evolution. In this paper, the algorithm is demonstrated with a particle filter and with power cycling experimental tests performed until complete wire-bond failure.

Abstract 295 | PDF Downloads 408

##plugins.themes.bootstrap3.article.details##

Keywords

power cycling, IGBT module, Wire-bond failure, On-state voltage, Degradation model, Electrical model, Particle filter

Section
Tehnical Papers